DocumentCode
1083595
Title
Magnetic transistor behavior explained by modulation of emitter injection, not carrier deflection
Author
Vinal, A.W. ; Masnari, N.A.
Author_Institution
IBM Corporation, Research Triangle Park, NC
Volume
3
Issue
8
fYear
1982
fDate
8/1/1982 12:00:00 AM
Firstpage
203
Lastpage
205
Abstract
Novel dual-base, dual-collector, lateral transistors operating in the presence of dc and ac magnetic fields, demonstrate that the differential current at the collector is the result of emitter injection modulation and not carrier deflection. An understanding of basic operating principles has resulted in the design of optimized lateral- and vertical-injecting transitor configurations. The latter exhibit voltage sensitivities exceeding 20 V/T for NPN silicon, at room temperature, and a signal-to-noise ratio of 105for a 1 T magnetic field. A frequency response in excess of 50 MHz should be possible for load resistances less than 1000 ohms.
Keywords
Bipolar transistors; Design optimization; Helium; Magnetic devices; Magnetic fields; Magnetic modulators; Signal to noise ratio; Silicon; Temperature sensors; Voltage;
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/EDL.1982.25551
Filename
1482656
Link To Document