• DocumentCode
    1083595
  • Title

    Magnetic transistor behavior explained by modulation of emitter injection, not carrier deflection

  • Author

    Vinal, A.W. ; Masnari, N.A.

  • Author_Institution
    IBM Corporation, Research Triangle Park, NC
  • Volume
    3
  • Issue
    8
  • fYear
    1982
  • fDate
    8/1/1982 12:00:00 AM
  • Firstpage
    203
  • Lastpage
    205
  • Abstract
    Novel dual-base, dual-collector, lateral transistors operating in the presence of dc and ac magnetic fields, demonstrate that the differential current at the collector is the result of emitter injection modulation and not carrier deflection. An understanding of basic operating principles has resulted in the design of optimized lateral- and vertical-injecting transitor configurations. The latter exhibit voltage sensitivities exceeding 20 V/T for NPN silicon, at room temperature, and a signal-to-noise ratio of 105for a 1 T magnetic field. A frequency response in excess of 50 MHz should be possible for load resistances less than 1000 ohms.
  • Keywords
    Bipolar transistors; Design optimization; Helium; Magnetic devices; Magnetic fields; Magnetic modulators; Signal to noise ratio; Silicon; Temperature sensors; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/EDL.1982.25551
  • Filename
    1482656