• DocumentCode
    1083753
  • Title

    On the False-Positive Rate of Statistical Equipment Comparisons Based on the Kruskal–Wallis H Statistic

  • Author

    De Vries, Dirk K. ; Chandon, Yves

  • Author_Institution
    NXP Semicond., Crolles
  • Volume
    20
  • Issue
    3
  • fYear
    2007
  • Firstpage
    286
  • Lastpage
    292
  • Abstract
    Using Monte Carlo simulation, we investigate the accuracy of the chi2 approximation used in statistical equipment comparison based on the Kruskal-Wallis H statistic. We show that this approximation is conservative and gives an incorrect false-positive rate on individual steps as well as on the full process flow statistical equipment comparison. Alternative approximations of Wallace are investigated and these are shown to perform significantly better in analysis of datasets typical of semiconductor manufacturing. Wallace approximations also improve the ranking of signals.
  • Keywords
    Monte Carlo methods; nonparametric statistics; semiconductor device manufacture; semiconductor technology; statistical testing; ANOVA; Kruskal-Wallis H statistical test; Kruskal-Wallis test; Monte Carlo simulation; Wallace approximations; Wilcoxon rank sum test; beta approximation; chi-square approximation; nonparametric tests; semiconductor manufacturing yield; statistical equipment comparisons; Analysis of variance; Data analysis; Manufacturing processes; Performance analysis; Semiconductor device manufacture; Statistical analysis; Statistical distributions; Statistics; Terminology; Testing; ANOVA; Kruskal–Wallis test; Mann–Whitney; Wilcoxon rank sum test; beta approximation; chi-square; commonality analysis; nonparametric tests;
  • fLanguage
    English
  • Journal_Title
    Semiconductor Manufacturing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0894-6507
  • Type

    jour

  • DOI
    10.1109/TSM.2007.901398
  • Filename
    4285823