Title :
Correction to "Voltage-Comparator-Based Measurement of Equivalentiy Samlpled Substrate Noise Wavefor
Author :
Tsukada ; Matsuura, T. ; Hotta, Masao
Keywords :
Analog circuits; Circuit noise; Circuit simulation; Integrated circuit measurements; Integrated circuit noise; Noise measurement; Semiconductor device noise; Solid state circuits; Substrates; Voltage;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.1996.508275
