• DocumentCode
    1083852
  • Title

    The fabrication and performance of planar doped barrier diodes as 200 GHz subharmonically pumped mixers

  • Author

    Lee, Trong-Huang ; East, Jack R. ; Chi, Chen-Yu ; Rebeiz, Gabriel M. ; Dengler, Robert J. ; Mehdi, Imran ; Siegel, Peter H. ; Haddad, George I.

  • Author_Institution
    NASA/Center for Space Terahertz Technol., Michigan Univ., Ann Arbor, MI, USA
  • Volume
    42
  • Issue
    4
  • fYear
    1994
  • fDate
    4/1/1994 12:00:00 AM
  • Firstpage
    742
  • Lastpage
    749
  • Abstract
    The PDB (planar doped barrier) diode consists of a p+ doping spike between two intrinsic layers and n+ ohmic contacts. Such devices can have an anti-symmetric current vs. voltage characteristic. The capacitance is approximately constant with the applied voltage, and the barrier height and device capacitance are easily adjustable. These characteristics make the PDB a candidate for millimeter- and submillimeter-wave subharmonic mixers. We have fabricated 2 and 4 μm diameter diodes with different barrier designs using GaAs epi-layers. The devices are planarized using an air-bridge and a surface channel etch. After completely removing the substrate, the devices are mounted on a quartz substrate to reduce parasitic effects. Diced diodes were tested as subharmonic mixers around 200 GHz in both a quasi-optical planar wideband subharmonic receiver and a planar-diode waveguide-mixer. The quasi-optical measurements show that a 0.23 V (and 0.4 V) barrier height GaAs diode with 2.0 μA (and 5 nA) of saturation current gives a DSB conversion loss of 10.8 dB (and 9.5 dB) and a DSB noise temperature of 3795° K and 2450° K). The waveguide mixer measurements were made with a similar 0.23 V barrier height PDB. Such a mixer has a minimum conversion loss of 10.2 dB and noise temperature of 3570° K, and requires only 1.2 milliwatts of available LO power
  • Keywords
    III-V semiconductors; doping profiles; gallium arsenide; mixers (circuits); semiconductor device noise; semiconductor diodes; solid-state microwave devices; 2 micron; 200 GHz; 4 micron; 9.5 to 10.8 dB; DSB conversion loss; DSB noise temperature; EHF; GaAs; GaAs epi-layers; MM-wave diode; SiO2; air-bridge; anti-symmetric I-V characteristic; barrier height; current/voltage characteristic; device capacitance; fabrication; intrinsic layers; millimeter-wave mixers; n+ ohmic contacts; p+ doping spike; planar doped barrier diodes; planar-diode waveguide-mixer; quartz substrate; quasi-optical planar wideband subharmonic receiver; subharmonically pumped mixers; submillimeter-wave mixers; surface channel etch; Acoustical engineering; Current measurement; Diodes; Doping; Fabrication; Gallium arsenide; Loss measurement; Noise measurement; Temperature; Voltage;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.285089
  • Filename
    285089