Title :
Envelope-domain time series (ET) behavioral model of a Doherty RF power amplifier for system design
Author :
Wood, John ; Lefevre, Michael ; Runton, David ; Nanan, Jean-Christophe ; Noori, Basim H. ; Aaen, Peter H.
Author_Institution :
RE Div., Freescale Semicond. Inc, Tempe, AZ
Abstract :
In this paper, we present an envelope-domain behavioral model of a high-power RF amplifier. In this modeling approach, we use the signal envelope information, and the behavioral model is generated using an established nonlinear time-series approach to create a time-domain model that operates in the envelope or signal domain. We have generated a model of a 200-W Doherty amplifier from measured IQ data taken using a wideband code-division multiple-access excitation; the amplifier was driven from the linear regime into saturation. The time-series model was created using a time-delay embedding identified from auto-mutual information analysis, and an artificial neural network was used to fit the multivariate transfer function. The model has been validated using measured and simulated data, and it has been used in the development of a system-level design of a digital pre-distorter
Keywords :
circuit analysis computing; code division multiple access; microwave power amplifiers; neural nets; time series; time-domain analysis; transfer functions; 200 W; Doherty RF power amplifier; artificial neural network; digital predistorter; envelope-domain behavioral model; high-power RF amplifier; information analysis; multivariate transfer function; nonlinear time-series approach; signal envelope; system design; time delay embedding; time series behavioral model; time-domain model; wideband code-division multiple-access; Artificial neural networks; Broadband amplifiers; Information analysis; Multiaccess communication; Power amplifiers; Power system modeling; Radio frequency; Radiofrequency amplifiers; Signal generators; Time domain analysis; Power amplifiers; modeling; nonlinear circuits; nonlinear systems;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.2006.879134