Experimental characterization of the nonlinear behavior of RF amplifiers

Author

Rolain, Yves ; Van Moer, Wendy ; Pintelon, Rik ; Schoukens, Johan

Author_Institution

Electr. Meas. Dept., Vrije Univ., Brussels

Volume

54

Issue

8

fYear

2006

Firstpage

3209

Lastpage

3218

Abstract

Using specifically designed broadband periodic random excitation signals, the best linear approximation of RF amplifiers is measured. The proposed technique: 1) takes into account the measurement uncertainty and the nonlinear distortions and 2) detects, quantifies, and classifies the nonlinear distortions with confidence bounds. The approach is suitable for the experimental characterization of existing amplifiers

Keywords

approximation theory; measurement uncertainty; nonlinear distortion; nonlinear network analysis; radiofrequency amplifiers; random processes; RF amplifiers; confidence bounds; excitation signals; linear approximation; measurement uncertainty; microwave amplifier; nonlinear behavior characterization; nonlinear distortions; Linear approximation; Multiaccess communication; Nonlinear distortion; Nonlinear systems; OFDM; Performance evaluation; RF signals; Radio frequency; Radiofrequency amplifiers; US Government; Linear approximation; linear characteristics; microwave amplifier; nonlinear distortions; system identification;

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/TMTT.2006.879168

Filename

1668337