• DocumentCode
    1084284
  • Title

    Theory and application of nongroup cellular automata for synthesis of easily testable finite state machines

  • Author

    Chakraborty, Supratik ; Chowdhury, Dipanwita Roy ; Chaudhuri, Parimal Pal

  • Author_Institution
    Dept. of Electr. Eng., Stanford Univ., Palo Alto, CA, USA
  • Volume
    45
  • Issue
    7
  • fYear
    1996
  • fDate
    7/1/1996 12:00:00 AM
  • Firstpage
    769
  • Lastpage
    781
  • Abstract
    The paper reports some of the interesting properties and relationships of a nongroup cellular automata (CA) and its dual. A special class of nongroup cellular automata denoted as D1*CA is analytically investigated. Based on such analysis, D1*CA has been proposed as an ideal test machine which can be efficiently embedded in a finite state machine to enhance the testability of the synthesized design. A state encoding algorithm has been formulated to embed the D1*CA based test machine in the synthesized FSM while minimizing the hardware overhead. The unique state transition properties of D1*CA are then used in designing an easy testing scheme for the FSM. Experiments on FSM benchmarks have shown that the scheme achieves 100% coverage of all single stuck at faults at the cost of hardware overhead and circuit delay that are comparable, if not better, to that incurred for scan path based designs. However, the major advantage of the scheme is the significant reduction of test time overhead due to integration of an embedded test machine in the design at the synthesis phase
  • Keywords
    cellular automata; design for testability; fault location; finite state machines; logic testing; sequential circuits; sequential machines; D1*CA; easily testable finite state machine synthesis; embedded test machine; nongroup cellular automata; scan path based designs; single stuck at faults; state encoding algorithm; synthesis for testability; synthesis phase; synthesized FSM; test machine; testable sequential machines; unique state transition properties; Automata; Automatic testing; Built-in self-test; Circuit synthesis; Circuit testing; Encoding; Hardware; Logic testing; Sequential analysis; Sequential circuits;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/12.508316
  • Filename
    508316