DocumentCode
1084284
Title
Theory and application of nongroup cellular automata for synthesis of easily testable finite state machines
Author
Chakraborty, Supratik ; Chowdhury, Dipanwita Roy ; Chaudhuri, Parimal Pal
Author_Institution
Dept. of Electr. Eng., Stanford Univ., Palo Alto, CA, USA
Volume
45
Issue
7
fYear
1996
fDate
7/1/1996 12:00:00 AM
Firstpage
769
Lastpage
781
Abstract
The paper reports some of the interesting properties and relationships of a nongroup cellular automata (CA) and its dual. A special class of nongroup cellular automata denoted as D1*CA is analytically investigated. Based on such analysis, D1*CA has been proposed as an ideal test machine which can be efficiently embedded in a finite state machine to enhance the testability of the synthesized design. A state encoding algorithm has been formulated to embed the D1*CA based test machine in the synthesized FSM while minimizing the hardware overhead. The unique state transition properties of D1*CA are then used in designing an easy testing scheme for the FSM. Experiments on FSM benchmarks have shown that the scheme achieves 100% coverage of all single stuck at faults at the cost of hardware overhead and circuit delay that are comparable, if not better, to that incurred for scan path based designs. However, the major advantage of the scheme is the significant reduction of test time overhead due to integration of an embedded test machine in the design at the synthesis phase
Keywords
cellular automata; design for testability; fault location; finite state machines; logic testing; sequential circuits; sequential machines; D1*CA; easily testable finite state machine synthesis; embedded test machine; nongroup cellular automata; scan path based designs; single stuck at faults; state encoding algorithm; synthesis for testability; synthesis phase; synthesized FSM; test machine; testable sequential machines; unique state transition properties; Automata; Automatic testing; Built-in self-test; Circuit synthesis; Circuit testing; Encoding; Hardware; Logic testing; Sequential analysis; Sequential circuits;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/12.508316
Filename
508316
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