DocumentCode :
1084620
Title :
Effects of grain isolation on magnetic properties of c-axis uniaxially in-plane oriented barium hexaferrite thin films
Author :
Chen, Yingjian ; Sui, Xiaoyu ; Kryder, Mark H.
Author_Institution :
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
Volume :
32
Issue :
4
fYear :
1996
fDate :
7/1/1996 12:00:00 AM
Firstpage :
3313
Lastpage :
3318
Abstract :
Magnetic properties of c-axis uniaxially in-plane aligned Ba-ferrite thin films were studied. Ba-ferrite thin films on [110] a-plane single-crystal sapphire substrates were deposited by low-power RF diode sputtering. Different degrees of grain isolation were achieved via postdeposition annealing at various temperatures in a rapid thermal annealing furnace. In this study, a magnetic evaluation of intergranular interaction was carried out using the well-established remanent magnetization ΔM curve. The results presented indicate a positive magnetostatic interaction, the strength of which is correlated with grain separation when measured along the magnetic easy axis direction. A predominant negative magnetostatic interaction was observed when measured along the magnetic hard axis direction, the magnitude of which is relatively independent of further grain separation
Keywords :
barium compounds; ferrites; magnetic thin films; rapid thermal annealing; remanence; sputtered coatings; BaFe12O19; [110] a-plane single-crystal sapphire substrate; c-axis uniaxially in-plane oriented barium hexaferrite thin film; easy axis; grain isolation; hard axis; intergranular magnetostatic interaction; low-power RF diode sputtering; magnetic properties; rapid thermal annealing; remanent magnetization; Diodes; Furnaces; Magnetic films; Magnetic properties; Magnetic separation; Magnetostatics; Radio frequency; Rapid thermal annealing; Sputtering; Temperature;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.508396
Filename :
508396
Link To Document :
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