DocumentCode
1084879
Title
Electron-velocity saturation at a BJT collector junction under low-level conditions
Author
Warner, R.M., Jr. ; Ju, Dong Hyuk ; Grung, Bernard
Author_Institution
University of Minnesota, Minneapolis, MN
Volume
30
Issue
3
fYear
1983
fDate
3/1/1983 12:00:00 AM
Firstpage
230
Lastpage
236
Abstract
The consequences of electron-velocity saturation at the collector junction of an n-p-n biopolar junction transistor (BJT) are examined in a manner similar to that employed by Middlebrook twenty years ago. Dimensional shrinkage, especially in base thickness, that has occurred over this time interval causes a change in the prediction of this analysis from a negligible effect twenty years ago to a significant effect today, even in the low-level regime. However, a more detailed analysis considering the electron profile near the collector junction yields the somewhat surprising result that the linear portion of the base-region electron profile is quite unaffected by velocity saturation, in spite of the fact that the minimum electron density nc in the collector region can exceed by many orders of magnitude the equilibrium electron density in the base region. The reason for this is a scaling phenomenon wherein the linear-profile extrapolation rotates about a point on the x axis that is invariant with respect to current throughout the low-level range and approximately invariant with respect to base-region doping. Furthermore, this point on the
axis is very close to the depletion-approximation boundary of the collector-junction space-charge layer. Hence, the classical assumption of vanishing electron density at the boundary of the collector space-charge region constitutes an excellent approximation for low-level conditions. Incidental to the detailed analysis are updated empirical expressions for electron velocity saturation, and an application of the general solution for step junctions that was offered recently.
axis is very close to the depletion-approximation boundary of the collector-junction space-charge layer. Hence, the classical assumption of vanishing electron density at the boundary of the collector space-charge region constitutes an excellent approximation for low-level conditions. Incidental to the detailed analysis are updated empirical expressions for electron velocity saturation, and an application of the general solution for step junctions that was offered recently.Keywords
Cause effect analysis; Current density; Electron emission; Electron mobility; Extrapolation; Shape; Transistors;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1983.21105
Filename
1483006
Link To Document