Design model for bulk CMOS scaling enabling accurate latchup prediction

The integration density of advanced bulk CMOS structures heavily depends on SCR type of latch up. Depending on the technology chosen the n-p-n-p-n-p interaction, which can be fired by noise, destroys tile stored information or even the chip itself. This paper presents the first complete two-dimensional numerical analysis for a typical CMOS structure including latchup path in the "OFF," "ON," "firing" and "sustaining" mode. Results and experimental data are discussed and used to develop a simplified, yet accurate CMOS design model. This allows the calculation of the firing and sustaining edge depending on geometrical and processing data.