Title :
High brightness GaP green LED´s
Author :
Niina, Tatsuhiko ; Yamaguchi, Takao ; Yamazawa, Tadanobu ; Ishii, Toshihiko ; Takasu, Hiromi ; Inoue, Kentaro
Author_Institution :
Sanyo Electric Company, Ltd., Osaka, Japan
fDate :
4/1/1983 12:00:00 AM
Abstract :
High brightness GaP green LED´s have been developed by optimizing growth conditions to obtain a high quality p-n junction. In particular, the n-type GaP layer near the junction is greatly lowered in carrier concentration in order to decrease the nonradiative recombination center. The carrier concentration in the n-type GaP layer is decreased to 5-6 × 1015/cm3near the p-n junction and a minority-carrier lifetime of 800 ns (measured through the EL decay time) is obtained. The best device has a quantum efficiency of 0.45 percent at 12.5 A/cm^{2} with encapsulation. Excellent high-brightness LED lamps of 400 m Cd at a driving current of 20 mA can be obtained by using the high efficiency GaP green LED´s.
Keywords :
Brightness; Doping; Encapsulation; Furnaces; Helium; LED lamps; Light emitting diodes; P-n junctions; Substrates; Time measurement;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1983.21114