Minimizing production test time to detect faults in analog circuits

Author

Milor, Linda ; Sangiovanni-Vincentelli, Alberto L.

Author_Institution

Dept. of Electr. Eng., Maryland Univ., College Park, MD, USA

Volume

13

Issue

6

fYear

1994

fDate

6/1/1994 12:00:00 AM

Firstpage

796

Lastpage

813

Abstract

Analog testing is a difficult task without a clearcut methodology. Analog circuits are tested for satisfying their specifications, not for faults. Given the high cost of testing analog specifications, it is proposed that tests for analog circuits should be designed to detect faults. Therefore analog fault modeling is discussed. Based on an analysis of the types of tests needed for different types of faults, algorithms for fault-driven test set selection are presented. A major reduction in testing time should come from reducing the number of specification tests that need to be performed. Hence algorithms are presented for minimizing specification testing time. After specification testing time is minimized, the resulting test sets are supplemented with some simple, possibly non-specification, tests to achieve 100% fault coverage. Examples indicate that fault-driven test set development can lead to drastic reductions in production testing time

Keywords

analogue circuits; automatic testing; circuit analysis computing; fault location; integrated circuit testing; linear integrated circuits; production testing; 100% fault coverage; IC testing; analog circuits; analog fault modeling; fault detection; fault-driven test set selection; production test time; specification testing time; Analog circuits; Circuit faults; Circuit testing; Costs; Electrical fault detection; Fabrication; Fault detection; Manufacturing; Performance evaluation; Production;

fLanguage

English

Journal_Title

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on

Publisher

ieee

ISSN

0278-0070

Type

jour

DOI

10.1109/43.285252

Filename

285252