• DocumentCode
    1085461
  • Title

    4H-SiC UV photo detectors with large area and very high specific detectivity

  • Author

    Yan, Feng ; Xin, Xiaobin ; Aslam, Shahid ; Yuegang Zhao ; Franz, David ; Zhao, Yuegang ; Weiner, Maurice

  • Author_Institution
    Raytheon/NASA-Goddard Space Flight Center, Greenbelt, MD, USA
  • Volume
    40
  • Issue
    9
  • fYear
    2004
  • Firstpage
    1315
  • Lastpage
    1320
  • Abstract
    Pt/4H-SiC Schottky photodiodes have been fabricated with the device areas up to 1 cm2. The I-V characteristics and photoresponse spectra have been measured and analyzed. For a 5 mm×5 mm area device leakage current lower than 10-15 A at zero bias and 1.2×10-14 A at -1 V have been established. The quantum efficiency is over 30% from 240 to 320 nm. The specific detectivity, D*, has been calculated from the directly measured leakage current and quantum efficiency are shown to be higher than 1015 cmHz12//W from 210 to 350 nm with a peak D* of 3.6×1015 cmHz12//W at 300 nm.
  • Keywords
    Schottky diodes; photodetectors; platinum; silicon compounds; wide band gap semiconductors; -1 V; 1.2E-14 A; 210 to 350 nm; 4H-SiC UV photodetectors; 5 mm; Pt/4H-SiC Schottky photodiodes; SiC-Pt; leakage current; photoresponse spectra; quantum efficiency; specific detectivity; Earth; Gallium nitride; Infrared detectors; Leak detection; Leakage current; Photodetectors; Photodiodes; Radiation detectors; Semiconductor device noise; Silicon carbide; Leakage current; Schottky diodes; photodiode; ultraviolet detectors;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/JQE.2004.833196
  • Filename
    1327782