• DocumentCode
    1085520
  • Title

    Thermal characterization of a 149-lead VLSI package with heatsink

  • Author

    Wesling, Paul B.

  • Author_Institution
    Tandem Comput. Inc., Cupertino, CA, USA
  • Volume
    11
  • Issue
    4
  • fYear
    1988
  • fDate
    12/1/1988 12:00:00 AM
  • Firstpage
    512
  • Lastpage
    515
  • Abstract
    The steady-state and dynamic thermal characteristics of a 149-lead hermetic PGA (pin-grid array) package are studied, with focus on three different configurations of a stacked-fin heatsink and on two types of fillers for the epoxy heatsink attach adhesive. The package described has high thermal performance in an air-cooled regime. Data are presented showing thermal resistance from junction to ambient as a function of the number of heatsink fins and the composition of the heatsink-attach epoxy. At nominal conditions, thermal resistance from junction to ambient of the selected 5-fin heatsink and aluminium-filled epoxy adhesive is less than 6°C/W at an airflow of 2.5 m/s (500 linear ft/min). Also discussed is the function-to-case thermal resistance, measured per SEMI Standard G30-86. A value of 2.1°C/W was measured for the package
  • Keywords
    VLSI; heat sinks; packaging; SEMI Standard G30-86; VLSI package; air-cooled regime; airflow; epoxy heatsink attach adhesive; heatsink; hermetic PGA; pin-grid array; stacked-fin heatsink; thermal characteristics; thermal resistance; Aluminum; Ceramics; Electrical resistance measurement; Electronics packaging; Integrated circuit packaging; Resistance heating; Semiconductor device packaging; Sockets; Thermal resistance; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0148-6411
  • Type

    jour

  • DOI
    10.1109/33.16691
  • Filename
    16691