DocumentCode :
1085900
Title :
Two-dimensional oxidation
Author :
Chin, Daeje ; Oh, Soo-Young ; Hu, Shih-ming ; Dutton, Robert W. ; Moll, John L.
Author_Institution :
Stanford University, Stanford, CA
Volume :
30
Issue :
7
fYear :
1983
fDate :
7/1/1983 12:00:00 AM
Firstpage :
744
Lastpage :
749
Abstract :
This paper introduces the first general two-dimensional oxidation model based on steady-state oxygen diffusion and the slow incompressible viscous flow of oxide. The moving-boundary problem is solved through a novel numerical technique based on pressure/velocity iteration and a boundary-value approach. The simulation results obtained for oxide shape and bird´s beak size versus pad-oxide thickness are in excellent agreement with experiments. This model is also able to calculate stress on the silicon interface during oxidation; this calculated value (6 × 109dyne/cm2) also agrees with the measurement and reveals the tendency of stress to decrease with increasing pad-oxide thickness.
Keywords :
Etching; Impurities; Laplace equations; Oxidation; Shape; Silicon; Steady-state; Stress; Two dimensional displays; Very large scale integration;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1983.21204
Filename :
1483105
Link To Document :
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