Title :
Tied Factor Analysis for Face Recognition across Large Pose Differences
Author :
Prince, Simon J D ; Warrell, Jonathan ; Elder, James H. ; Felisberti, Fatima M.
Author_Institution :
Dept. of Comput. Sci., Univ. Coll. London, London
fDate :
6/1/2008 12:00:00 AM
Abstract :
Face recognition algorithms perform very unreliably when the pose of the probe face is different from the gallery face: typical feature vectors vary more with pose than with identity. We propose a generative model that creates a one-to-many mapping from an idealized "identity" space to the observed data space. In identity space, the representation for each individual does not vary with pose. We model the measured feature vector as being generated by a pose-contingent linear transformation of the identity variable in the presence of Gaussian noise. We term this model "tied" factor analysis. The choice of linear transformation (factors) depends on the pose, but the loadings are constant (tied) for a given individual. We use the EM algorithm to estimate the linear transformations and the noise parameters from training data. We propose a probabilistic distance metric that allows a full posterior over possible matches to be established. We introduce a novel feature extraction process and investigate recognition performance by using the FERET, XM2VTS, and PIE databases. Recognition performance compares favorably with contemporary approaches.
Keywords :
face recognition; feature extraction; Gaussian noise; face recognition; feature extraction process; generative model; one-to-many mapping; pose differences; pose-contingent linear transformation; tied factor analysis; Computer vision; Face and gesture recognition; Algorithms; Artificial Intelligence; Biometry; Face; Facial Expression; Factor Analysis, Statistical; Humans; Image Enhancement; Image Interpretation, Computer-Assisted; Likelihood Functions; Pattern Recognition, Automated; Reproducibility of Results; Sensitivity and Specificity; Subtraction Technique;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
DOI :
10.1109/TPAMI.2008.48