• DocumentCode
    1086137
  • Title

    Breakdown Phenomena in Nitrogen Due to Repetitive Nanosecond-pulses

  • Author

    Shao, Tao ; Sun, Guangsheng ; Yan, Ping ; Zhang, Shichang

  • Author_Institution
    Chinese Acad. of Sci., Beijing
  • Volume
    14
  • Issue
    4
  • fYear
    2007
  • Firstpage
    813
  • Lastpage
    819
  • Abstract
    Nanosecond-pulse breakdown indicates special characteristics depending on the pulse rise-time and duration. Based on a repetitive nanosecond-pulse generator, breakdown phenomena of parallel-plane gaps in nitrogen were investigated with single pulse and repetitive bursts under different gap conditions. The relationships between applied voltage, pulse repetition frequency, breakdown time lag, repetitive pulse stress time and the number of applied pulses are presented. The curves regarding E-field strength, breakdown time lag and gas pressure are also obtained. The experimental results show that breakdown characteristics with repetitive nanosecond-pulses are different from that with single pulse. Repetitive nanosecond-pulse breakdown is concerned with the accumulation effect that is attributed to residual ions and metastable species survived from previous pulses. In addition, a modified empirical formula about E-field strength, breakdown time lag and gas density is given for the breakdown data.
  • Keywords
    electric breakdown; pulse generators; pulsed power technology; E-field strength; applied voltage; breakdown phenomena; breakdown time lag; gas pressure; metastable species; nitrogen; parallel-plane gaps; pulse duration; pulse repetition frequency; pulse rise-time; repetitive nanosecond-pulses; repetitive pulse stress time; residual ions; Breakdown voltage; Dielectric breakdown; Dielectrics and electrical insulation; Electric breakdown; Frequency; Gases; Nitrogen; Power system reliability; Pulse power systems; Space vector pulse width modulation;
  • fLanguage
    English
  • Journal_Title
    Dielectrics and Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9878
  • Type

    jour

  • DOI
    10.1109/TDEI.2007.4286511
  • Filename
    4286511