DocumentCode :
1086713
Title :
High-performance 980-nm strained-layer GaInAs-GaInAsP-GaInP quantum-well lasers grown by all solid-source molecular-beam epitaxy
Author :
Savolainen, Pekka ; Toivonen, Mika ; Asonen, Hany ; Pessa, Markus ; Murison, Richard
Author_Institution :
Dept. of Phys., Tampere Univ. of Technol., Finland
Volume :
8
Issue :
8
fYear :
1996
Firstpage :
986
Lastpage :
988
Abstract :
High-performance strained-layer GaInAs-GaInAsP-GaInP separate-confinement quantum-well lasers emitting at /spl lambda/=980 nm were grown by all solid-source molecular-beam epitaxy. Valved cracker cells were employed to generate group-V beam fluxes. Fabricated ridge-waveguide lasers exhibited stable, kink-free, single-mode operation up to 260 mW. A maximum output power of 550 mW was achieved. Complete thermal roll-over tests were done tens of times without any sign of degradation for p-side up-mounted lasers. Preliminary lifetime tests for over 4500 h at 150-mW power level indicate that these aluminum-free pump lasers are very reliable sources for pumping light into erbium-doped fiber amplifiers.
Keywords :
III-V semiconductors; gallium arsenide; gallium compounds; indium compounds; infrared sources; laser modes; laser stability; life testing; molecular beam epitaxial growth; optical fabrication; optical pumping; optical testing; quantum well lasers; semiconductor device testing; semiconductor growth; waveguide lasers; 150 mW; 260 mW; 4500 h; 550 mW; 980 nm; GaInAs-GaInAsP-GaInP; all solid-source molecular-beam epitaxy; aluminum-free pump lasers; complete thermal roll-over tests; erbium-doped fiber amplifiers; group-V beam fluxes; high-performance; lifetime tests; mW power level; maximum output power; nm strained-layer GaInAs-GaInAsP-GaInP quantum-well lasers; p-side up-mounted lasers; pumping light; reliable sources; ridge-waveguide lasers; stable kink-free single-mode operation; valved cracker cells; Erbium-doped fiber lasers; Laser beams; Laser excitation; Laser stability; Molecular beam epitaxial growth; Power generation; Pump lasers; Quantum well lasers; Testing; Thermal degradation;
fLanguage :
English
Journal_Title :
Photonics Technology Letters, IEEE
Publisher :
ieee
ISSN :
1041-1135
Type :
jour
DOI :
10.1109/68.508712
Filename :
508712
Link To Document :
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