• DocumentCode
    1087019
  • Title

    Accurate wavelength determination in a Wollaston interferometer for sensor applications

  • Author

    Jiang, X.Q. ; Kemp, J. ; Ning, Y.N. ; Palmer, A.W. ; Grattan, K.T.V.

  • Author_Institution
    Dept. of Electr. Electron. & Inf. Eng., City Univ., London, UK
  • Volume
    8
  • Issue
    8
  • fYear
    1996
  • Firstpage
    1055
  • Lastpage
    1057
  • Abstract
    A novel wavelength measurement scheme, for practical wavelength-dependent optical sensor applications, configured with the use of an additional known wavelength as a self-reference to achieve high measurement accuracy over a range of tens of nanometers is described and presented.
  • Keywords
    CCD image sensors; light interferometers; measurement errors; optical polarisers; optical prisms; optical variables measurement; CCD image sensors; Wollaston interferometer; additional known wavelength; high measurement accuracy; self-reference; sensor applications; wavelength determination; wavelength measurement scheme; wavelength-dependent optical sensor applications; Charge coupled devices; Interference; Optical interferometry; Optical modulation; Optical sensors; Optical surface waves; Q measurement; Sensor phenomena and characterization; Spectroscopy; Wavelength measurement;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/68.508736
  • Filename
    508736