• DocumentCode
    1087291
  • Title

    Selective low-pressure silicon epitaxy for MOS and bipolar transistor application

  • Author

    Kürten, Hans ; Voss, Heinz-Jürgen ; Kim, Wonchan ; Engl, Walter L.

  • Author_Institution
    Technische Hochschule Aachen, Aachen, Germany
  • Volume
    30
  • Issue
    11
  • fYear
    1983
  • fDate
    11/1/1983 12:00:00 AM
  • Firstpage
    1511
  • Lastpage
    1515
  • Abstract
    The selective low-pressure epitaxy is presented in this paper. In contrast to LOCOS technology, this process starts with structuring a thick field oxide by anisotropic RIE etching. Then monocrystalline silicon is grown selectively in the windows formed. Si-gate MOS transistors have been produced using this technology. In the field of bipolar transistors, reactive ion etching and selective low-pressure epitaxy has been used to optimize the Schottky collector transistor to a nearly one-dimensional structure. These transistors have been built on a submicrometer epitaxial layer.
  • Keywords
    Anisotropic magnetoresistance; Bipolar transistors; Epitaxial growth; Etching; Isolation technology; MOSFETs; Oxidation; Resists; Silicon; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1983.21330
  • Filename
    1483231