Title :
Exact closed form aliasing probability in class of multiple input signature registers
Author :
Edirisooriya, G. ; Robinson, J. Paul
Author_Institution :
Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA
Abstract :
Linear feedback shift registers (LFSRs) are commonly used in built-in self-test schemes to compact the test response. Compaction introduces the problem of aliasing. An exact closed form expression for the aliasing probability for a class of multiple input LFSRs for equiprobable independent bit errors is derived.
Keywords :
built-in self test; digital integrated circuits; integrated circuit testing; shift registers; aliasing probability; class of multiple input LFSRs; equiprobable independent bit errors; exact closed form expression; linear feedback shift registers; multiple input signature registers;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19910995
