• DocumentCode
    1087495
  • Title

    Comparative Study of VLSI Solutions to Independent Component Analysis

  • Author

    Du, Hongtao ; Qi, Hairong ; Wang, Xiaoling

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Tennessee Univ., Knoxville, TN
  • Volume
    54
  • Issue
    1
  • fYear
    2007
  • Firstpage
    548
  • Lastpage
    558
  • Abstract
    The advent of independent component analysis (ICA) has brought a paradigm shift to signal and image processing. ICA that extracts independent source signals by searching for a linear or nonlinear transformation and minimizing the statistical dependence between components has the promise of effective unsupervised signal separation capability. Due to the computation complexity of ICA and commonly high-volume data sets used in signal and image processing, the ICA process, however, is very time-consuming. Very large scale integration (VLSI) solutions with optimal parallelism provide potentially faster and even real-time implementations for ICA algorithms. In this paper, the authors study these solutions and discuss their limits. Critical challenges are identified, and issues associated with the VLSI implementation of ICA algorithms are designed. Design recommendations that have potentials in performing complicated ICA algorithms on large throughput are provided
  • Keywords
    VLSI; image processing; independent component analysis; integrated circuit design; source separation; ICA; VLSI solutions; computation complexity; image processing; independent component analysis; signal processing; source signal extraction; very large scale integration; Algorithm design and analysis; Circuits; Field programmable gate arrays; Hardware; Image processing; Independent component analysis; Parallel processing; Signal processing; Source separation; Very large scale integration; Application-specific integrated circuit (ASIC); CMOS integrated circuits; field-programmable gate array (FPGA); independent component analysis (ICA); reconfigurable architectures; very large scale integration (VLSI);
  • fLanguage
    English
  • Journal_Title
    Industrial Electronics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0046
  • Type

    jour

  • DOI
    10.1109/TIE.2006.885491
  • Filename
    4084665