DocumentCode
1087731
Title
IIIB-2 quantification of photon generation in CMOS VLSI structures
Author
Gerosa, G. ; Stern, Sebastian ; Bastani, B. ; Chwang, R.
Volume
30
Issue
11
fYear
1983
fDate
11/1/1983 12:00:00 AM
Firstpage
1580
Lastpage
1581
Keywords
Current measurement; Hot carriers; Impact ionization; MOSFETs; Optical microscopy; Optical scattering; P-n junctions; Particle scattering; Silicon; Very large scale integration;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1983.21365
Filename
1483266
Link To Document