Title :
Sliding Mode Neuro-Adaptive Control of Electric Drives
Author :
Topalov, Andon Venelinov ; Cascella, Giuseppe Leonardo ; Giordano, Vincenzo ; Cupertino, Francesco ; Kaynak, Okyay
Author_Institution :
Control Syst. Dept., Tech. Univ., Plovdiv
Abstract :
An innovative variable-structure-systems-based approach for online training of neural network (NN) controllers as applied to the speed control of electric drives is presented. The proposed learning algorithm establishes an inner sliding motion in terms of the controller parameters, leading the command error towards zero. The outer sliding motion concerns the controlled electric drive, the state tracking error vector of which is simultaneously forced towards the origin of the phase space. The equivalence between the two sliding motions is demonstrated. In order to evaluate the performance of the proposed control scheme and its practical feasibility in industrial settings, experimental tests have been carried out with electric motor drives. Crucial problems such as adaptability, computational costs, and robustness are discussed. Experimental results illustrate that the proposed NN-based speed controller possesses a remarkable learning capability to control electric drives, virtually without requiring a priori knowledge of the plant dynamics and laborious startup procedures
Keywords :
adaptive control; angular velocity control; learning (artificial intelligence); machine vector control; motor drives; neurocontrollers; tracking; variable structure systems; command error; electric motor drives; inner sliding motion; learning algorithm; neural network controllers; online training; sliding mode neuro-adaptive control; speed control; state tracking error vector; variable structure systems; Electric variables control; Error correction; Force control; Industrial control; Motion control; Neural networks; Sliding mode control; Testing; Tracking; Velocity control; Adaptive control; electric drives; neural networks (NNs); variable structure systems;
Journal_Title :
Industrial Electronics, IEEE Transactions on
DOI :
10.1109/TIE.2006.888930