We have measured gain spectra for TE polarization in a GaInAsP/InP laser as a function of dc bias current below laser threshold. The measurements were made on a low-threshold device with a stripe geometry defined by proton bombardment. A number of other characteristics of this and similar devices from the same wafer are also reported. These data permit the maximum gain coefficient of the active layer g
maxto be evaluated as a function of nominal current density J
nom. We obtain the linear relationship

, where η
ris the radiative quantum efficiency. Our data apply only for large gain (

cm
-1) and large J
nombecause the active layer of the test device is thin (0.1 μm).