DocumentCode :
1087986
Title :
Gain spectra in GaInAsP/InP proton-bombarded stripe-geometry DH lasers
Author :
Walpole, James N. ; Lind, Thomas A. ; Hsieh, Jaw Jim ; Donnelly, Joseph P.
Author_Institution :
Lincoln Laboratory, MIT, Lexington, MA, USA
Volume :
17
Issue :
2
fYear :
1981
fDate :
2/1/1981 12:00:00 AM
Firstpage :
186
Lastpage :
192
Abstract :
We have measured gain spectra for TE polarization in a GaInAsP/InP laser as a function of dc bias current below laser threshold. The measurements were made on a low-threshold device with a stripe geometry defined by proton bombardment. A number of other characteristics of this and similar devices from the same wafer are also reported. These data permit the maximum gain coefficient of the active layer gmaxto be evaluated as a function of nominal current density Jnom. We obtain the linear relationship g_{\\max } = (3.1 \\times 10^{-2}/\\eta_{r})(J_{nom} - \\eta_{r} 5.4 \\times 10^{3}) , where ηris the radiative quantum efficiency. Our data apply only for large gain ( g g\\sim 150 cm-1) and large Jnombecause the active layer of the test device is thin (0.1 μm).
Keywords :
Gallium materials/lasers; Proton radiation effects; Semiconductor device radiation effects; Current density; Current measurement; DH-HEMTs; Gain measurement; Geometrical optics; Indium phosphide; Polarization; Protons; Tellurium; Testing;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/JQE.1981.1071075
Filename :
1071075
Link To Document :
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