DocumentCode :
1088044
Title :
Design and DCVS implementation of a self-checking bus-monitor unit for highly reliable fault-tolerant system configurations
Author :
Markas, Tassos ; Royals, D. Mark ; Kanopoulos, Nick
Author_Institution :
Center for Digital Syst. Res., Res. Triangle Inst., Research Triangle Park, NC, USA
Volume :
2
Issue :
2
fYear :
1994
fDate :
6/1/1994 12:00:00 AM
Firstpage :
149
Lastpage :
156
Abstract :
We present the design and implementation of a bus-monitor unit targeted for the design of highly reliable fault-tolerant systems. The bus-monitor is designed using differential cascode voltage switch (DCVS) logic, whose inherent characteristics result in self-checking circuits. It is implemented in an application specific integrated circuit that can be used to implement a variety of fault-tolerant architectures including triple modular redundant and hybrid configurations. The unit is capable of detecting and correcting failures in the redundant modules by monitoring their respective buses, and it delivers fault-free data to the destination modules. The unit is also capable of detecting faults occurring in the unit itself by utilizing the fault secure properties of DCVS logic. In this paper, we present the operation of the bus-monitor unit and we describe its DCVS design and implementation, as well as the performance characteristics of the prototype chips. Finally, we illustrate how the bus-monitor unit(s) can be used to implement highly reliable fault-tolerant architectures, and we demonstrate that architectures designed using the developed unit(s) exhibit higher reliability compared to the ones implemented with CMOS logic, using the same number of computational resources.<>
Keywords :
CMOS integrated circuits; application specific integrated circuits; circuit reliability; integrated logic circuits; logic design; logic testing; DCVS design; DCVS implementation; DCVS logic; bus-monitor unit; buses; destination modules; differential cascode voltage switch logic; fault detection; fault secure properties; fault-free data; fault-tolerant architectures; highly reliable fault-tolerant architectures; highly reliable fault-tolerant system configurations; performance characteristics; redundant modules; reliability; self-checking bus-monitor unit; self-checking circuits; triple modular redundant configurations; Circuit faults; Computer architecture; Fault detection; Fault tolerance; Fault tolerant systems; Integrated circuit reliability; Logic design; Switches; Switching circuits; Voltage;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/92.285742
Filename :
285742
Link To Document :
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