DocumentCode :
1088071
Title :
RSYN: a system for automated synthesis of reliable multilevel circuits
Author :
De, Kaushik ; Natarajan, Chitra ; Nair, Devi ; Banerjee, Prithviraj
Author_Institution :
Center for Reliable & High Performance Comput., Illinois Univ., Urbana, IL, USA
Volume :
2
Issue :
2
fYear :
1994
fDate :
6/1/1994 12:00:00 AM
Firstpage :
186
Lastpage :
195
Abstract :
Conventional logic synthesis systems are targeted towards reducing the area required by a logic block, as measured by the literal count or gate count; or, improving the performance in terms of gate delays; or, improving the testability of the synthesized circuit, as measured by the irredundancy of the resultant circuit. In this paper, we address the problem of developing reliability driven logic synthesis algorithms for multilevel logic circuits, which are integrated within the MIS synthesis system. Our procedures are based on concurrent error detection techniques that have been proposed in the past for two level circuits, and adapting those techniques to multilevel logic synthesis algorithms. Three schemes for concurrent error detection in a multilevel circuit are proposed in this paper, using which all the single stuck at faults in the circuit can be detected concurrently. The first scheme uses duplication of a given multilevel circuit with the addition of a totally self-checking comparator. The second scheme proposes a procedure to generate the multilevel circuit from a two level representation under some constraint such that, the Berger code of the output vector can be used to detect any single fault inside the circuit, except at the inputs. A constrained technology mapping procedure is also presented in this paper. The third scheme is based on parity codes on the outputs. The outputs are partitioned using a novel partitioning algorithm, and each partition is implemented using a multilevel circuit. Some additional parity coded outputs are generated. In all three schemes, all the necessary checkers are generated automatically and the whole circuit is placed and routed using the Timberwolf layout package. The area overheads for several benchmark examples are reported in this paper. The entire procedure is integrated into a new system called RSYN.<>
Keywords :
VLSI; circuit layout CAD; circuit reliability; error detection; integrated logic circuits; logic CAD; logic testing; many-valued logics; Berger code; MIS synthesis system; RSYN; automated synthesis; concurrent circuit fault detection; concurrent error detection; error detection techniques; gate count; gate delays; irredundancy; literal count; logic block area reduction; logic synthesis system; multilevel circuit; multilevel logic circuits; multilevel logic synthesis algorithms; reliability driven logic synthesis algorithms; reliable multilevel circuits; resultant circuit; self-checking comparator; stuck at faults; synthesized circuit testability; Area measurement; Circuit faults; Circuit synthesis; Circuit testing; Delay; Electrical fault detection; Fault detection; Integrated circuit synthesis; Logic circuits; Logic testing;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/92.285745
Filename :
285745
Link To Document :
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