Totally self-checking CMOS circuit design for breaks and stuck-on faults

Author

Cheema, Manjit S. ; Lala, P.K.

Author_Institution

Dept. of Electr. Eng., North Carolina Agric. & Tech. State Univ., Greensboro, NC, USA

Volume

27

Issue

8

fYear

1992

fDate

8/1/1992 12:00:00 AM

Firstpage

1203

Lastpage

1206

Abstract

A technique for designing totally self-checking FCMOS circuits is presented. Two types of defects have been considered: breaks (caused by missing conducting material or extra insulating material) and transistor stuck-on faults. In order to make FCMOS circuits totally self-checking for all breaks and transistor stuck-on faults, only four extra transistors need to be added to the functional circuit. The additional circuitry is added in such a way that for any break or transistor stuck-on defect in the functional circuit, the outputs assume a value of 01 or 10, respectively. The output of the defect-free circuit will be 11 (00) when the input pattern applied to the circuit connects V _dd(GND) to the output node

Keywords

CMOS integrated circuits; built-in self test; fault location; integrated logic circuits; logic design; logic testing; CMOS circuit design; breaks; stuck-on faults; totally self-checking; Automatic testing; CMOS logic circuits; CMOS technology; Circuit faults; Circuit synthesis; Circuit testing; Conducting materials; Insulation; Large scale integration; Semiconductor device modeling;

fLanguage

English

Journal_Title

Solid-State Circuits, IEEE Journal of

Publisher

ieee

ISSN

0018-9200

Type

jour

DOI

10.1109/4.148330

Filename

148330