• DocumentCode
    1088150
  • Title

    On concurrent error location and correction of FFT networks

  • Author

    Oh, Choong Gun ; Youn, Hee Yong

  • Author_Institution
    Dept. of Comput. Sci. Eng., Texas Univ., Arlington, TX, USA
  • Volume
    2
  • Issue
    2
  • fYear
    1994
  • fDate
    6/1/1994 12:00:00 AM
  • Firstpage
    257
  • Lastpage
    260
  • Abstract
    Fault tolerance has been one of the major issues for the VLSI based FFT networks. In this paper, two efficient approaches for concurrent error location and correction of FFT networks are proposed. Using our approach, a faulty component can be located at an additional try followed by log/sub 2/m comparisons of m corrupted outputs. An error can also be corrected, once it is detected, at a small modification of basic module with an additional try. Moreover, our approaches are general in the sense that they can be implemented with any concurrent error detection scheme employing a checksum approach for FFT networks.<>
  • Keywords
    VLSI; circuit reliability; digital signal processing chips; error correction; error detection; fast Fourier transforms; fault tolerant computing; DSP chips; FFT networks; VLSI based networks; checksum approach; concurrent error correction; concurrent error location; fault tolerance; Discrete Fourier transforms; Error correction; Fast Fourier transforms; Fault detection; Fault tolerant systems; Hardware; Oral communication; Spectral analysis; Throughput; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/92.285753
  • Filename
    285753