DocumentCode
1088150
Title
On concurrent error location and correction of FFT networks
Author
Oh, Choong Gun ; Youn, Hee Yong
Author_Institution
Dept. of Comput. Sci. Eng., Texas Univ., Arlington, TX, USA
Volume
2
Issue
2
fYear
1994
fDate
6/1/1994 12:00:00 AM
Firstpage
257
Lastpage
260
Abstract
Fault tolerance has been one of the major issues for the VLSI based FFT networks. In this paper, two efficient approaches for concurrent error location and correction of FFT networks are proposed. Using our approach, a faulty component can be located at an additional try followed by log/sub 2/m comparisons of m corrupted outputs. An error can also be corrected, once it is detected, at a small modification of basic module with an additional try. Moreover, our approaches are general in the sense that they can be implemented with any concurrent error detection scheme employing a checksum approach for FFT networks.<>
Keywords
VLSI; circuit reliability; digital signal processing chips; error correction; error detection; fast Fourier transforms; fault tolerant computing; DSP chips; FFT networks; VLSI based networks; checksum approach; concurrent error correction; concurrent error location; fault tolerance; Discrete Fourier transforms; Error correction; Fast Fourier transforms; Fault detection; Fault tolerant systems; Hardware; Oral communication; Spectral analysis; Throughput; Very large scale integration;
fLanguage
English
Journal_Title
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher
ieee
ISSN
1063-8210
Type
jour
DOI
10.1109/92.285753
Filename
285753
Link To Document