DocumentCode :
1088187
Title :
VIA-1 impact ionization in
Author :
Armiento, C.A. ; Groves, S.H.
Volume :
30
Issue :
11
fYear :
1983
fDate :
11/1/1983 12:00:00 AM
Firstpage :
1607
Lastpage :
1607
Keywords :
Avalanche photodiodes; Charge carrier processes; Chemicals; Crystallography; Etching; Gallium arsenide; Impact ionization; Indium phosphide; Laboratories; Noise measurement;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1983.21404
Filename :
1483305
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1088187
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