Title :
VIA-4 reliability of VPE long-wavelength lasers and detectors
Author :
Olsen, G.H. ; Digiuseppe, N.J. ; Zamerowski, T.J.
fDate :
11/1/1983 12:00:00 AM
Keywords :
Dark current; Degradation; Detectors; Electrons; Epitaxial layers; Gold; Indium gallium arsenide; Indium phosphide; Laboratories; Temperature;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1983.21407
