• DocumentCode
    1088216
  • Title

    VIA-4 reliability of VPE long-wavelength lasers and detectors

  • Author

    Olsen, G.H. ; Digiuseppe, N.J. ; Zamerowski, T.J.

  • Volume
    30
  • Issue
    11
  • fYear
    1983
  • fDate
    11/1/1983 12:00:00 AM
  • Firstpage
    1609
  • Lastpage
    1610
  • Keywords
    Dark current; Degradation; Detectors; Electrons; Epitaxial layers; Gold; Indium gallium arsenide; Indium phosphide; Laboratories; Temperature;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1983.21407
  • Filename
    1483308