Title :
VIB-1 modeling of single particle soft error generation in bipolar random access memories
Author :
Zoutendyk, John A.
Author_Institution :
California Institute of Technology, Pasadena, CA
fDate :
11/1/1983 12:00:00 AM
Keywords :
Bipolar transistor circuits; Circuit simulation; Computer simulation; Integrated circuit modeling; Nuclear and plasma sciences; Process design; Propulsion; Random access memory; Read-write memory; Single event upset;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1983.21412
