DocumentCode
108843
Title
Testbench Qualification of SystemC TLM Protocols through Mutation Analysis
Author
Bombieri, Nicola ; Fummi, F. ; Guarnieri, Valerio ; Pravadelli, Graziano
Author_Institution
Dept. of Comput. Sci., Univ. of Verona, Verona, Italy
Volume
63
Issue
5
fYear
2014
fDate
May-14
Firstpage
1248
Lastpage
1261
Abstract
Transaction-level modeling (TLM) has become the de-facto reference modeling style for system-level design and verification of embedded systems. It allows designers to implement high-level communication protocols for simulations up to 1000 × faster than at register-transfer level (RTL). To guarantee interoperability between TLM IP suppliers and users, designers implement the TLM communication protocols by relying on a reference standard, such as the standard OSCI for SystemC TLM. Functional correctness of such protocols as well as their compliance to the reference TLM standard are usually verified through user-defined testbenches, whose high quality and completeness play a key role for an efficient TLM design and verification flow. This article presents a methodology to apply mutation analysis, a technique applied in literature for SW testing, for measuring the testbench quality in verifying TLM protocols. In particular, the methodology aims at (i) qualifying the testbenches by considering both the TLM protocol correctness and their compliance to a defined standard (i.e., OSCI TLM), (ii) optimizing the simulation time during mutation analysis by avoiding mutation redundancies, and (iii) driving the designers in the testbench improvement. Experimental results on benchmarks of different complexity and architectural characteristics are reported to analyze the methodology applicability.
Keywords
formal verification; program testing; RTL; SystemC TLM protocol; TLM design; embedded system; high-level communication protocol; mutation analysis; register-transfer level; standard OSCI; testbench qualification; transaction-level modeling; verification flow; Analytical models; Libraries; Protocols; Standards; Testing; Time domain analysis; Time varying systems; Transaction-level modeling (TLM); functional qualification; mutation analysis;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/TC.2012.301
Filename
6399466
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