• DocumentCode
    1088549
  • Title

    Simulating 3D waveguide discontinuities using a combination of Prony´s method and FDTD with improved absorbing boundary conditions

  • Author

    Vielva, L.A. ; Pereda, J.A. ; Vegas, A. ; Prieto, A.

  • Author_Institution
    Dept. de Electron., Cantabria Univ., Santander, Spain
  • Volume
    141
  • Issue
    2
  • fYear
    1994
  • fDate
    4/1/1994 12:00:00 AM
  • Firstpage
    127
  • Lastpage
    132
  • Abstract
    Two major problems usually arise when the finite-difference time-domain (FDTD) method is used for wideband characterisation of dielectric discontinuities with high permittivity in waveguides. First, reflections are provoked by imperfections in the absorbing boundary conditions. Secondly, many time steps are necessary to overcome the problems associated with the truncation error inherent in the discrete Fourier transform (DFT). The authors present wideband absorbing boundary conditions (ABC) that have been designed to provide optimal behaviour for the analysis of waveguide devices. As an alternative to the classical fast Fourier transform (FFT), Prony´s method is used to process the data provided by FDTD in order to obtain the frequency parameters. It was found that this alternative method significantly reduces the CPU time needed to characterise the different devices. The improvements obtained are clearly shown by analysing different dielectric discontinuities in waveguides. The results are compared both with those given by the classical FDTD-FFT method and with those provided by the finite elements method in the frequency domain
  • Keywords
    boundary-value problems; dielectric waveguides; electromagnetic wave absorption; electromagnetic wave reflection; finite difference time-domain analysis; permittivity; waveguide components; waveguide theory; 3D waveguide discontinuities; CPU time; FDTD; FDTD-FFT method; Prony´s method; absorbing boundary conditions; dielectric discontinuities; finite elements method; finite-difference time-domain method; frequency domain; frequency parameters; high permittivity; reflections; scattering parameters; simulation; truncation error; waveguide devices; wideband characteristics;
  • fLanguage
    English
  • Journal_Title
    Microwaves, Antennas and Propagation, IEE Proceedings
  • Publisher
    iet
  • ISSN
    1350-2417
  • Type

    jour

  • DOI
    10.1049/ip-map:19941026
  • Filename
    285804