• DocumentCode
    1088566
  • Title

    Application of submillimeter wave lasers to high voltage cable inspection

  • Author

    Cantor, Arnold J. ; Cheo, Peter K. ; Foster, Martin C. ; Newman, Leon A.

  • Author_Institution
    United Technologies Research Center, East Hartford, CT
  • Volume
    17
  • Issue
    4
  • fYear
    1981
  • fDate
    4/1/1981 12:00:00 AM
  • Firstpage
    477
  • Lastpage
    489
  • Abstract
    An experimental device designed for real-time, nondestructive inspection of cross-linked polyethylene insulation during cable manufacture has been built, analyzed, and tested under laboratory conditions. The device detects scattered far-infrared (FIR) laser energy at 118.8 μm from imperfections, such as voids and contaminants, known to have a serious deleterious influence on cable in-service lifetime. As presently configured, the device can readily detect voids as small as 100 μm in diameter in a cable 2.8 cm in diameter moving past the sensor at 5 cm/s. Better performance of the liquid helium cooled Ga-doped Ge detectors could lead to a significant improvement in void detection capability.
  • Keywords
    Electromagnetic (EM) scattering; Inspection; Laser applications; Polyethylene-insulated cables, cross-linked; Power cable insulation testing; Submillimeter-wave lasers; Submillimeter-wave measurements; Cable insulation; Inspection; Insulation testing; Laboratories; Manufacturing; Nondestructive testing; Polyethylene; Scattering; Submillimeter wave devices; Voltage;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/JQE.1981.1071133
  • Filename
    1071133