DocumentCode :
1088577
Title :
New GaAs n+-p- delta (n+)-i- delta (p+)-i-n+ switching device grown by molecular beam epitaxy
Author :
Liu, Wei-Chang ; Sun, C.-Y.
Author_Institution :
Dept. of Electr. Eng., Nat. Cheng-Kung Univ., Tainan, Taiwan
Volume :
27
Issue :
19
fYear :
1991
Firstpage :
1704
Lastpage :
1706
Abstract :
A new GaAs switching device with an n+-p- delta (n+)-i- delta (p+)-i-n+ structure has been demonstrated. An interesting S-shaped negative differential resistance (NDR) is shown to occur that originates from the avalanche multiplications within the delta (n+)-i- delta (p+)-i sawtooth doped superlattice (SDS). The excellent NDR behaviour gives the studied structure good potential for switching device applications. Furthermore, with an adequate design, the studied structure can be applied to fabricate a new functional device.
Keywords :
III-V semiconductors; gallium arsenide; impact ionisation; molecular beam epitaxial growth; negative resistance effects; semiconductor epitaxial layers; semiconductor superlattices; semiconductor switches; GaAs; S-shaped negative differential resistance; avalanche multiplications; functional device; molecular beam epitaxy; n +-p- delta (n +)-i- delta (p +)-i-n + structure; sawtooth doped superlattice; switching device;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19911061
Filename :
132945
Link To Document :
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