DocumentCode :
1088747
Title :
Automated Derivation of Application-Aware Error Detectors Using Static Analysis: The Trusted Illiac Approach
Author :
Pattabiraman, Karthik ; Kalbarczyk, Zbigniew T. ; Iyer, Ravishankar K.
Author_Institution :
Univ. of British Columbia (UBC), Vancouver, BC, Canada
Volume :
8
Issue :
1
fYear :
2011
Firstpage :
44
Lastpage :
57
Abstract :
This paper presents a technique to derive and implement error detectors to protect an application from data errors. The error detectors are derived automatically using compiler-based static analysis from the backward program slice of critical variables in the program. Critical variables are defined as those that are highly sensitive to errors, and deriving error detectors for these variables provides high coverage for errors in any data value used in the program. The error detectors take the form of checking expressions and are optimized for each control-flow path followed at runtime. The derived detectors are implemented using a combination of hardware and software and continuously monitor the application at runtime. If an error is detected at runtime, the application is stopped so as to prevent error propagation and enable a clean recovery. Experiments show that the derived detectors achieve low-overhead error detection while providing high coverage for errors that matter to the application.
Keywords :
error detection; program compilers; program slicing; security of data; software fault tolerance; software reliability; application-aware error detectors; backward program slice; compiler-based static analysis; control-flow path; data error protection; error propagation; fault tolerance; low-overhead error detection; software engineering reliability; trusted Illiac approach; Application software; Computer bugs; Computer crashes; Detectors; Error correction; Fault tolerance; Hardware; Program processors; Protection; Runtime; Error checking; and fault tolerance; fault tolerance.; reconfigurable hardware; reliability; software engineering (reliability); testing;
fLanguage :
English
Journal_Title :
Dependable and Secure Computing, IEEE Transactions on
Publisher :
ieee
ISSN :
1545-5971
Type :
jour
DOI :
10.1109/TDSC.2009.23
Filename :
5089331
Link To Document :
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