DocumentCode
1088815
Title
The temperature dependence of the threshold current of GaInAsP/InP DH lasers
Author
Asada, Masahiro ; Adams, Alfred R. ; Stubkjaer, Kristian E. ; Suematsu, Yasuharu ; Itaya, Yoshio ; Arai, Shigehisa
Author_Institution
Tokyo Institute of Technology, Tokyo, Japan
Volume
17
Issue
5
fYear
1981
fDate
5/1/1981 12:00:00 AM
Firstpage
611
Lastpage
619
Abstract
The temperature dependence of the threshold current of GaInAsP/InP lasers was considered in terms of linear gain, loss, and carder lifetime. The linear gain was calculated taking into account electronic intraband relaxation effects. The carrier lifetime, intraband relaxation time, loss in the active region, and dipole moment, all of which determine the threshold condition, were estimated from the experiments. The main loss mechanism which determines the temperature dependence of the differential quantum efficiency appears to be the absorption due to transitions between the split-off and heavy-hole valence bands. The temperature dependence of the theoretical threshold current Ith calculated in terms of these parameters was compared with the measured results and reasonable agreement was obtained.
Keywords
Gallium materials/lasers; Laser thermal factors; Optical fiber transmitters; Absorption; Charge carrier lifetime; Current measurement; DH-HEMTs; Gain; Indium phosphide; Life estimation; Lifetime estimation; Temperature dependence; Threshold current;
fLanguage
English
Journal_Title
Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
0018-9197
Type
jour
DOI
10.1109/JQE.1981.1071158
Filename
1071158
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