DocumentCode :
1088864
Title :
Selectively-doped Al0.48In0.52As/Ga0.47In0.53As heterostructure field effect transistor
Author :
Pearsall, T.P. ; Hendel, R. ; O´Connor, P. ; Alavi, K. ; Cho, A.Y.
Author_Institution :
Bell Laboratories, Murray Hill, NJ
Volume :
4
Issue :
1
fYear :
1983
fDate :
1/1/1983 12:00:00 AM
Firstpage :
5
Lastpage :
8
Abstract :
Selectively-doped depletion-mode FET´s which show full pinch-off at 295 K with transconductance in excess of 90 mS/mm and contact resistance less than 0.4 Ω-mm have been fabricated. The device properties reported represent a significant improvement over previously published work on an equivalent structure, because of improvements in growth technique and modifications in the device structure. Analysis of our measurement at room temperature suggests that the two-dimensional electron gas at the hetero-interface is not the dominant contributor to the total device current.
Keywords :
Buffer layers; Conductivity; Contact resistance; Current measurement; Doping; Electrical resistance measurement; Electron mobility; Indium phosphide; Leakage current; Milling;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/EDL.1983.25625
Filename :
1483369
Link To Document :
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