Title :
AlxGa1−xN Ultraviolet Avalanche Photodiodes Grown on GaN Substrates
Author :
Yoo, Dongwon ; Limb, Jae ; Ryou, Jae-Hyun ; Zhang, Yun ; Shen, Shyh-Chiang ; Dupuis, Russell D. ; Hanser, Drew ; Preble, Edward ; Evans, Keith
Author_Institution :
Georgia Inst. of Technol., Atlanta
Abstract :
AlxGa1-xN (x=0.05) ultraviolet (UV) avalanche photodiodes grown on a GaN substrate are reported. The epitaxial structure was grown by metal-organic chemical vapor deposition on a free-standing bulk GaN substrate having low dislocation density. The growth conditions for AlxGa1-xN epitaxial layers on GaN substrates were optimized to achieve improved crystalline and structural quality. With UV illumination at lambda~250 nm, devices with mesa diameters of ~30 mum achieve stable maximum optical gains of ~50 at a reverse bias voltage of ~87 V.
Keywords :
III-V semiconductors; MOCVD; aluminium compounds; avalanche photodiodes; dislocation density; gallium compounds; p-i-n photodiodes; photodetectors; semiconductor epitaxial layers; semiconductor growth; ultraviolet detectors; wide band gap semiconductors; crystalline quality; dislocation density; epitaxial structure; free-standing bulk gallium nitride substrate; mesa diameters; metal-organic chemical vapor deposition; optical gains; p-i-n UV APD; reverse bias voltage; ultraviolet avalanche photodiodes; Aluminum gallium nitride; Avalanche photodiodes; Gallium nitride; III-V semiconductor materials; Materials science and technology; Optical filters; Optical materials; Optical sensors; Silicon carbide; Substrates; Aluminum gallium nitride; avalanche photodiodes (APDs); epitaxial growth; gallium nitride;
Journal_Title :
Photonics Technology Letters, IEEE
DOI :
10.1109/LPT.2007.902376