• DocumentCode
    1089088
  • Title

    The COMFET—A new high conductance MOS-gated device

  • Author

    Russell, J.P. ; Goodman, A.M. ; Goodman, L.A. ; Neilson, J.M.

  • Author_Institution
    RCA Laboratories, Princeton, NJ
  • Volume
    4
  • Issue
    3
  • fYear
    1983
  • fDate
    3/1/1983 12:00:00 AM
  • Firstpage
    63
  • Lastpage
    65
  • Abstract
    A new MOS gate-controlled power switch with a very low on-resistance is described. The fabrication process is similar to that of an n-channel power MOSFET but employs an n--epitaxial layer grown on a p+substrate. In operation, the epitaxial region is conductivity modulated (by excess holes and electrons) thereby eliminating a major component of the on-resistance. For example, on-resistance values have been reduced by a factor of about 10 compared with those of conventional n-channel power MOSFET´s of comparable size and voltage capability.
  • Keywords
    Anodes; Charge carrier processes; Conductivity; Fabrication; Latches; MOSFET circuits; Power MOSFET; Substrates; Thyristors; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/EDL.1983.25649
  • Filename
    1483393