Title :
Transistors made in single-crystal SOI films
Author :
Colinge, J.P. ; Demoulin, E. ; Bensahel, D. ; Auvert, G. ; Morel, H.
Author_Institution :
CNET, Meylan, France
fDate :
4/1/1983 12:00:00 AM
Abstract :
Test transistors with gate lengths ranging from 10 to 4 µm were made in laser-recrystallized silicon on insulator films. A capping layer of patterned antireflecting stripes of Si3N4was used to grow large single-crystals of silicon. MOS transistors show good electrical characteristics and a surface mobility up to 650 cm2/V.s for electrons. With the exception of the recrystallization procedure, the wafers followed a fully standard NMOS process, including the growth of a LOCOS field oxide.
Keywords :
Argon; Circuits; Electron mobility; Grain boundaries; MOS devices; MOSFETs; Power lasers; Semiconductor films; Silicon on insulator technology; Threshold voltage;
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/EDL.1983.25654