DocumentCode :
1089230
Title :
Performances of a frequency offset locked He-Xe laser system at 3.51 µm
Author :
Ohtsu, Motoichi ; Katsuragi, Seiichi ; Tako, Toshiharu
Author_Institution :
Tokyo Inst. of Tech., Yokohama, Japan
Volume :
17
Issue :
6
fYear :
1981
fDate :
6/1/1981 12:00:00 AM
Firstpage :
1100
Lastpage :
1107
Abstract :
A highly stabilized frequency offset locked He-Xe laser system was constructed for high resolution laser spectroscopy of H2CO [ 5_{1,5}(\\upsilon = 0) \\rightarrow 6_{0,6}(\\upsilon _{5}= 1) ] at 3.51μm. It is composed of three He-Xe lasers. The first laser is H2CO-stabilized and is used as a frequency reference in the system. The second laser is frequency offset locked to the first laser by using the beat frequency between these lasers, and is used as a local oscillator. The third laser is frequency offset locked to the second laser, and is used to observe the H2CO spectrum by slowly varying the beat frequency between these lasers. The frequency stability of the first laser, measured against a similarly stabilized and synchronously modulated laser, was 1.0\\times10^{-14} at \\tau = 100 s, where τ represents the integration time. The frequency traceability of the second laser to the first laser was expressed as 8.0\\times10^{-13} \\cdot \\tau ^{-1} for 10 ms \\leq \\tau \\leq 100 s. It was found that this value of the traceability was independent of the frequency modulation of the first and second lasers. The frequency traceability of the third laser to the second laser was nearly equal to that of the second laser described previously. The variable range of the frequency of the third laser was 19 MHz. In this range, the frequency traceability of the third laser to the second laser was independent of the beat frequency between these two lasers. From these results, it was concluded that this system can be used for the observation of the H2CO spectrum.
Keywords :
Infrared spectroscopy; Laser stability; Noble-gas lasers; Frequency measurement; Frequency modulation; Laboratories; Laser stability; Light sources; Local oscillators; Machinery; PROM; Spectroscopy; Time measurement;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/JQE.1981.1071199
Filename :
1071199
Link To Document :
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