DocumentCode
1089333
Title
Determination of source and drain parasitic resistances of HEMTs
Author
Pouvil, P. ; Zemour, B. ; Pasquet, Daniel ; Gaubert, Jean
Author_Institution
ENSEA, Cergy Pontoise, France
Volume
28
Issue
7
fYear
1992
fDate
3/26/1992 12:00:00 AM
Firstpage
618
Lastpage
620
Abstract
A practical method to evaluate the parasitic source resistance Rs and drain resistance Rd of high electron mobility transistors (HEMTs) is presented. DC results for Rs and Rd can be used as initial values in the determination of linear and nonlinear equivalent circuits by optimisation.
Keywords
electric resistance measurement; equivalent circuits; high electron mobility transistors; semiconductor device models; solid-state microwave devices; DC results; HEMTs; drain resistance; high electron mobility transistors; linear equivalent circuits; microwave performance; modelling; nonlinear equivalent circuits; optimisation; parasitic source resistance;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19920390
Filename
133027
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