DocumentCode
1089431
Title
Electron-beam programmable 128K-bit wafer-scale EPROM
Author
Shaver, D.C. ; Mountain, R.W. ; Silversmith, D.J.
Author_Institution
Massachusetts Institute of Technology, Lexington, MA
Volume
4
Issue
5
fYear
1983
fDate
5/1/1983 12:00:00 AM
Firstpage
153
Lastpage
155
Abstract
The feasibility of using an electron beam to customize and repair a wafer-scale n MOS system has been demonstrated. As the test vehicle, a 128K-bit EPROM was fabricated. All data bits and address decoders incorporate floating-gate FET´s, which act as links which can be turned on or off under electron-beam control. Each link can be programmed on 0.4 ms, and once programmed exhibits excellent nonvolatility. Because of the small link size, high programming speed, absence of debris, and ability to program without disturbing the integrity of the passivation, electron-beam programmable links may provide an attractive alternative to laser or fusible link repair and customization techniques.
Keywords
Decoding; EPROM; Electron beams; Integrated circuit interconnections; Nonvolatile memory; Passivation; Read only memory; Switches; Testing; Vehicles;
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/EDL.1983.25684
Filename
1483428
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