• DocumentCode
    1089431
  • Title

    Electron-beam programmable 128K-bit wafer-scale EPROM

  • Author

    Shaver, D.C. ; Mountain, R.W. ; Silversmith, D.J.

  • Author_Institution
    Massachusetts Institute of Technology, Lexington, MA
  • Volume
    4
  • Issue
    5
  • fYear
    1983
  • fDate
    5/1/1983 12:00:00 AM
  • Firstpage
    153
  • Lastpage
    155
  • Abstract
    The feasibility of using an electron beam to customize and repair a wafer-scale n MOS system has been demonstrated. As the test vehicle, a 128K-bit EPROM was fabricated. All data bits and address decoders incorporate floating-gate FET´s, which act as links which can be turned on or off under electron-beam control. Each link can be programmed on 0.4 ms, and once programmed exhibits excellent nonvolatility. Because of the small link size, high programming speed, absence of debris, and ability to program without disturbing the integrity of the passivation, electron-beam programmable links may provide an attractive alternative to laser or fusible link repair and customization techniques.
  • Keywords
    Decoding; EPROM; Electron beams; Integrated circuit interconnections; Nonvolatile memory; Passivation; Read only memory; Switches; Testing; Vehicles;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/EDL.1983.25684
  • Filename
    1483428