Title :
Consistent refractive index profile measurements of a step-index monomode optical fiber attained by several techniques
Author :
Gauthier, Francis ; Auge, Jaques ; Gallou, Dominique ; Wehr, Muryel ; Blaison, Serge
Author_Institution :
Thomson-CSF, Orsay, France
fDate :
6/1/1981 12:00:00 AM
Abstract :
The methods implemented in our laboratory-far field, near field, refracted near field, and interfetometry-allow one to characterize very accurately the parameters of a step-index single-mode fiber by comparing the results. The step-index profile is obtained with a silica core and a borosilicate cladding by the MCVD process. Experimental results from the above techniques show a good match, confirming the validity of the usual assumptions founding the theories employed. Among the techniques used, the refracted near field seems better to check any type of index profile, a delicate task to perform with other methods.
Keywords :
Optical fiber measurements; Optical refraction; Equations; Laboratories; Optical attenuators; Optical fiber communication; Optical fiber theory; Optical fibers; Optical interferometry; Optical refraction; Refractive index; Silicon compounds;
Journal_Title :
Quantum Electronics, IEEE Journal of
DOI :
10.1109/JQE.1981.1071221