DocumentCode :
1089616
Title :
Development of X-Shaped Filtered-Arc-Deposition (X-FAD) Apparatus and DLC/Cr Film Preparation
Author :
Tanoue, Hideto ; Hikosaka, Hiroki ; Iwasaki, Yasuhiro ; Takikawa, Hirofumi ; Sakakibara, Tateki ; Hasegawa, Yushi
Author_Institution :
Toyohashi Univ. of Technol., Aichi
Volume :
35
Issue :
4
fYear :
2007
Firstpage :
1014
Lastpage :
1019
Abstract :
An X-shaped filtered-arc-deposition (X-FAD) apparatus was developed in order to prepare hydrogen-free tetrahedral amorphous carbon (ta-C), which is a kind of diamond-like carbon (DLC), and metal film as a binding interlayer on the superhard alloy using a plasma beam irradiated from the same direction. First of all, the droplet-reduction performance was verified, and then, the appropriate duct-bias voltages and deposition rate were measured. Optima of duct biases for chromium (Cr) and DLC were found to be 25 and 15 V, respectively. From the result of X-ray diffraction analysis, it was found that Cr film that is prepared at a higher substrate-bias voltage was well crystallized and has less internal stress. The appropriate substrate bias for preparing ta-C was -100 to -200 V. DLC film was also prepared with substrate heating. It was found that ta-C could be prepared at a substrate temperature of less than 200degC, and the film was graphitized at higher temperature. By following these results, 2.5-mum-thick ta-C film was prepared on a superhard alloy with an interlayer by X-FAD.
Keywords :
X-ray diffraction; chromium; crystallisation; diamond-like carbon; films; internal stresses; plasma deposition; plasma devices; substrates; C - Surface; Cr - Surface; DLC preparation; X-FAD apparatus; X-ray diffraction analysis; X-shaped filtered-arc-deposition apparatus; binding interlayer; chromium; deposition rate; diamond-like carbon; droplet-reduction performance; duct-bias voltages; film preparation; hydrogen-free tetrahedral amorphous carbon; internal stress; metal film; plasma beam; size 2.5 mum; substrate heating; substrate temperature; superhard alloy; voltage 100 V to 200 V; voltage 15 V; voltage 25 V; Amorphous materials; Chromium; Diamond-like carbon; Ducts; Particle beams; Plasma measurements; Plasma temperature; Plasma x-ray sources; Substrates; Voltage; Binding interlayer; X-shape filtered-arc-deposition (X-FAD) system; chromium (Cr) film; diamond-like carbon (DLC); hydrogen-free tetrahedral amorphous carbon (ta-C);
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/TPS.2007.896755
Filename :
4287091
Link To Document :
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