DocumentCode :
1090281
Title :
Amorphous-Silicon gate GaAs FET´s
Author :
Suzuki, M. ; Murase, K. ; Asai, K. ; Kurumada, K.
Author_Institution :
NTT, Atsugi-shi, Japan
Volume :
4
Issue :
10
fYear :
1983
fDate :
10/1/1983 12:00:00 AM
Firstpage :
358
Lastpage :
359
Abstract :
Silicon-germanium-boron ternary amorphous alloy has been applied to GaAs FET as a gate contact material. A good Schottky contact with a barrier height as large as 0.94 V has been realized. Schottky-barrier gate GaAs FET´s fabricated using the amorphous film as a gate contact layer exhibit excellent normally off FET characteristics of a large saturated drain curent, which has never been attained by conventional GaAs MESFET´s.
Keywords :
Amorphous materials; FETs; Gallium arsenide; MESFET integrated circuits; P-n junctions; Plasma applications; Schottky barriers; Schottky diodes; Semiconductor films; Voltage;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/EDL.1983.25762
Filename :
1483506
Link To Document :
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