• DocumentCode
    1090344
  • Title

    A high-performance CMOS/SOS device with a gradually doped source—Drain extension structure

  • Author

    Chen, M.L. ; Leung, B.C. ; Lalevic, B.

  • Author_Institution
    RCA, Somerville, NJ
  • Volume
    4
  • Issue
    10
  • fYear
    1983
  • fDate
    10/1/1983 12:00:00 AM
  • Firstpage
    372
  • Lastpage
    374
  • Abstract
    A gradually doped source-drain extension (GDDE) CMOS/SOS structure with n+ poly gate has been used to fabricate a high-performance CMOS/SOS inverter ring oscillator and 1%8 static binary counter. The 0.8-µm gate ring oscillator shows 80-ps stage delay at V_{DD} = 5 V, and it achieves 0.1 pJ of speed-power product with 95-ps stage delay. The plasma-etched epi island minimizes the edge leakage current, as shown in subthreshold characteristics.
  • Keywords
    Etching; Fabrication; Implants; Leakage current; Plasma applications; Plasma devices; Plasma properties; Plasma sources; Plasma temperature; Ring oscillators;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/EDL.1983.25768
  • Filename
    1483512