• DocumentCode
    1090759
  • Title

    Reliability assurance for devices with a sudden-failure characteristic

  • Author

    Saul, R.H. ; Chen, F.S.

  • Author_Institution
    Bell Laboratories, Murray Hill, NJ
  • Volume
    4
  • Issue
    12
  • fYear
    1983
  • fDate
    12/1/1983 12:00:00 AM
  • Firstpage
    467
  • Lastpage
    468
  • Abstract
    Reliability assurance is particularly challenging for devices which have a sudden-failure characteristic. The use of a purging procedure which utilizes high thermal and nonthermal stresses is shown to have considerable promise in identifying for removal devices which otherwise fail early in the system life cycle.
  • Keywords
    Aging; Dark current; Indium gallium arsenide; Life estimation; Life testing; Photodiodes; Robustness; Temperature measurement; Thermal stresses; Underwater cables;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/EDL.1983.25805
  • Filename
    1483549
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1090759